Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy
A. Szucs et al., Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy, J PHYS CH B, 105(43), 2001, pp. 10579-10587
Interaction forces have been measured between (i) apposing layers of 2.0 +/
- 0.05 nm thick polydiallyl-dimethylammonium. chloride, PDDA, self-assemble
d onto a silicon wafer, silicon-substrate/PDDA, and onto a silicon micropar
ticle, attached to a tipless AMF catilever, SMP-AFM-tip/PDDA; (ii) apposing
layers of 2.0 +/- 0.05 nm thick montmorillonite, M, platelets, self-assemb
led onto the silicon-substrate/PDDA (silicon-substrate/PDDA/M) and onto the
SMP-AFM-tip/PDDA (SMP-AFM-tip/PDDA/M); (iii) apposing layers of silicon-su
bstrate/PDDA and SMP-AFM-tip/PDDA/M, and (iv) apposing layers of silicon-su
bstrate/PDDA/M and SMP-AFM-tip/PDDA by scanning force microscopy. Interacti
ons between the bare silicon substrate and the bare SMP-AFM-tip and those b
etween the silicon-substrate/PDDA and the bare SNIP-AFM-tip have also been
measured. The experimentally obtained force/radius vs probe-sample separati
on distance plots have been fitted to a simple exponential, taking advantag
e of the Derjaguin approximation for assessing the double-layer force betwe
en a charged sphere and a flat surface, and to the DLVO theory using the co
nstant potential numerical approximation (with the exception of ii, where c
onstant charge numerical approximation was used). Values for the adhesion (
the pull back) force, Debye-length, and surface potential have also been ev
aluated.