Background noise in a Cauchois-type high-resolution Compton scattering spectrometer at SPring-8

Authors
Sakurai, Y Hiraoka, N Itou, M Mizumaki, M Ohata, T Deb, A Toyokawa, H Suzuki, M Sakai, N
Citation
Y. Sakurai et al., Background noise in a Cauchois-type high-resolution Compton scattering spectrometer at SPring-8, J PHYS CH S, 62(12), 2001, pp. 2099-2102
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
ISSN journal
00223697 → ACNP
Volume
62
Issue
12
Year of publication
2001
Pages
2099 - 2102
Database
ISI
SICI code
0022-3697(200112)62:12<2099:BNIACH>2.0.ZU;2-U
Abstract
We have experimentally evaluated the background noise in a Cauchois-type hi gh-resolution Compton scattering spectrometer at SPring-8. The signal-to-no ise ratio (SIN) in the energy profile of Compton scattered X-rays from 3 mm thick Cu was found to be 78 at the Compton peak for the incident X-ray ene rgy of 115 keV. The experimental S/N is in good agreement with the value of 80 estimated from simple considerations. The achieved S/N in the spectrome ter is high enough for most Compton scattering experiments. (C) 2001 Elsevi er Science Ltd. All rights reserved.