Some investigations in holographic microscopic interferometry with respectto the estimation of stress and strain in micro-opto-electromechanical systems (MOEMS)
G. Wernicke et al., Some investigations in holographic microscopic interferometry with respectto the estimation of stress and strain in micro-opto-electromechanical systems (MOEMS), OPT LASER E, 36(5), 2001, pp. 475-485
Holographic microscopy with conjugate reconstruction for the interferometri
c determination of three-dimensional displacement was used for the investig
ation of the mechanical behaviour of micromechanic and microelectronic comp
onents. An experimental set-up for the exposure of the holographic interfer
ograms is described for the application of the spatial heterodyne technique
, for the application of phase shifting, and for electro-optic holography,
Three holograms for different illumination directions recorded on one holog
raphic plate were reconstructed conjugately, and spatial-heterodyne techniq
ue as well as phase-shift technique were used to evaluate the interferogram
s. Only by conjugated reconstruction. it is possible to obtain a perfectly
optimised interferometer for the static evaluation method. The evaluation o
f interferograms, which are strongly disturbed by speckle noise. can be per
formed successfully. A comparison of the results of the application of thes
e techniques is given. The influence of the speckle effect on the resolutio
n was investigated. (C) 2001 Elsevier Science Ltd. All rights reserved.