We present time-resolved photoluminescence investigations of field-effect s
tructures containing quantum dots (QDs). The high electrical field in those
devices significantly influences carrier dynamics, Photoluminescence (PL)
from the ground state occurs at an energy of 1.35 eV, but after strong exci
tation the PL band can reach up to 1.5 eV due to state filling. After stron
g excitation, a few hundred picoseconds of slow PL decay are observed. Then
the emission from the QDs performs a step-like quenching. The remaining lu
minescence has a long lifetime (about 1 ns) and its maximum occurs at about
1.35 eV. Numerical calculations suggest that the step-like PL quenching is
caused by a decay of screening of the electrical field in the region with
QDs.