Surfactant-mediated growth of giant magnetoresistance multilayers - art. no. 174418

Citation
W. Zou et al., Surfactant-mediated growth of giant magnetoresistance multilayers - art. no. 174418, PHYS REV B, 6417(17), 2001, pp. 4418
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6417
Issue
17
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011101)6417:17<4418:SGOGMM>2.0.ZU;2-N
Abstract
A series of experiments have been conducted to evaluate the magnetotranspor t properties of rf-diode-sputter-deposited giant magnetoresistive multilaye rs with either copper or copper-silver-gold nonferromagnetic (NFM) conducti ng layers. The study revealed that rf-diode-deposited multilayers utilizing Cu80Ag15Au5 as the NFM conducting layer possess significantly superior gia nt magnetoresistance to otherwise identical device architectures that used pure copper as the NFM conducting layer. To explore the origin of this effe ct, copper and Cu80Ag15Au5 films of varying thickness have been grown under identical deposition conditions and their surface morphology and roughness have been investigated. Atomic-force microscopy revealed significant rough ness and the presence of many pinholes in thin pure-copper films. The surfa ce roughness of the Cu80Ag15Au5 layers was found to be much less than that of pure copper, and the alloying eliminated the formation of pinholes. Usin g an embedded-atom-method alloy potential, molecular-dynamics simulations h ave been used to investigate the role of silver and gold upon the multilaye r growth process. The smoother growth surface of Cu80Ag15Au5 was found to p redominantly result from the addition of silver, which acts as a surfactant during growth. Molecular statistics estimates of atom migration energy bar riers indicated that both silver and gold have significantly higher mobilit ies than copper atoms on a flat copper surface. However, gold was found to be incorporated in the lattice whereas silver tended to segregate (and conc entrate) upon the free surface, enhancing its potency as a surfactant. The atomic-scale mechanism responsible for silver's surface-flattening effect h as been explored. We found that silver, when present at a led ge edge, redu ces the Ehrlich-Schwoebel barrier for copper, promoting a step-flow growth mode. Gold was also found to reduce the Ehrlich-Schwoebel barrier, but its potency was less than that of silver due to its lower surface concentration . These observations suggest that small alloy additions can be used to mani pulate the energy barriers that fundamentally control atomic assembly durin g vapor deposition, and provide a potentially powerful means of controlling the structure of thin films.