The onset of twinning in metals: A constitutive description

Citation
Ma. Meyers et al., The onset of twinning in metals: A constitutive description, ACT MATER, 49(19), 2001, pp. 4025-4039
Citations number
96
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
49
Issue
19
Year of publication
2001
Pages
4025 - 4039
Database
ISI
SICI code
1359-6454(20011114)49:19<4025:TOOTIM>2.0.ZU;2-Y
Abstract
A constitutive approach is developed that predicts the critical stress for twinning as a function of external (temperature, strain rate) and internal (grain size, stacking-fault energy) parameters. Plastic deformation by slip and twinning are considered as competitive mechanisms. The twinning stress is equated to the slip stress based on the plastic flow by thermally assis ted movement of dislocations over obstacles, which leads to successful pred iction of the slip-twinning transition. The model is applied to body center ed cubic, face centered cubic, and hexagonal metals and alloys: Fe, Cu, bra sses, and Ti, respectively. A constitutive expression for the twinning stre ss in BCC metals is developed using dislocation emission from a source and the formation of pile-ups, as rate-controlling mechanism. Employing an Eshe lby-type analysis, the critical size of twin nucleus and twinning stress ar e correlated to the twin-boundary energy, which is directly related to the stacking-fault energy (SFE) for FCC metals. The effects of grain size and S FE are examined and the results indicate that the grain-scale pile-ups are not the source of the stress concentrations giving rise to twinning in FCC metals. The constitutive description of the slip-twinning transition are in corporated into the Weertman-Ashby deformation mechanism maps, thereby enab ling the introduction of a twinning domain. This is illustrated for titaniu m with a grain size of 100 mum. (C) 2001 Acta Materialia Inc, Published by Elsevier Science Ltd. All rights reserved.