Block copolymer thin films: pattern formation and phase behavior

Citation
Pf. Green et R. Limary, Block copolymer thin films: pattern formation and phase behavior, ADV COLL IN, 94(1-3), 2001, pp. 53-81
Citations number
112
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ADVANCES IN COLLOID AND INTERFACE SCIENCE
ISSN journal
00018686 → ACNP
Volume
94
Issue
1-3
Year of publication
2001
Pages
53 - 81
Database
ISI
SICI code
0001-8686(20011115)94:1-3<53:BCTFPF>2.0.ZU;2-9
Abstract
During the last decade, research on thin, sub-micron thick, block copolymer films was devoted toward understanding and controlling microstructural. an d topographical features at temperatures T < T-ODT, where T-ODT is the orde r-disorder transition temperature below which thermodynamic interactions fa vor the formation of ordered (phase separated) microstructures. Symmetric d iblock copolymers, the subject, of this review, undergo an isotropic to lam ellar transition when T < T-ODT. Topographical features, 'islands' or 'hole s,' of these films typically reflect the underlying phase separation; and t he dimension of these features, normal to the substrate, is equal to the in terlamellar spacing, L. Two aspects of block copolymer thin films that have not received much attention are discussed in this paper: (1) pattern forma tion in symmetric block copolymers under conditions of T > T-ODT; and (2) p hase behavior of thin film symmetric diblock copolymer/homopolymer mixtures , when T < T-ODT. (C) 2001 Elsevier Science B.V. All rights reserved.