Energy-level alignment at the tris-(8-hydroxyquinolate)-aluminum/Gd interface and Gd-electron-injection layer for organic electroluminescent device

Citation
Sc. Kim et al., Energy-level alignment at the tris-(8-hydroxyquinolate)-aluminum/Gd interface and Gd-electron-injection layer for organic electroluminescent device, APPL PHYS L, 79(22), 2001, pp. 3726-3728
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
22
Year of publication
2001
Pages
3726 - 3728
Database
ISI
SICI code
0003-6951(20011126)79:22<3726:EAATTI>2.0.ZU;2-P
Abstract
The energy-level alignment for the tris-(8-hydroxyquinolate)-aluminum (Alq( 3))/Gd interface is determined by ultraviolet photoemission spectroscopy. T he energy difference between the Fermi level in Gd and the low-energy edge of the highest occupied molecular orbital in Alq(3) is 2.63 eV, and the vac uum level in the Alq(3) layer is moved upward to 0.35 eV with respect to it s intrinsic level. Gd/Al, Al:Li (0.1%), and Al were employed as a cathode f or the organic electroluminescent device. Among these devices, the device w ith the Gd-electron-injection layer has operated at the lowest voltage. (C) 2001 American Institute of Physics.