The application of X-ray scattering to the non-destructive determination of
physical properties of nanostructured materials is illustrated through use
of three example systems. High resolution parallel beam powder diffraction
is used to measure particle size and melting temperature in Sn nanoparticl
es while full reciprocal space mapping allows the mosaic distribution of Co
in epitaxial Ag films to be determined, The in-plane correlation length as
sociated with steps on Ag surfaces and the period of artificial gratings ar
e measured by grazing incidence scattering. (C) 2001 Elsevier Science B.V.
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