Gp. Felcher et Sge. Te Velthuis, Perspectives of polarized-neutron reflectometry: magnetic domains and off-specular scattering, APPL SURF S, 182(3-4), 2001, pp. 209-215
Specular reflectometry of polarized-neutrons was developed in the 1980s as
a tool for measuring magnetic depth profiles in flat films, which were late
rally uniform. When the lateral uniformity breaks down in an assembly of do
mains, off-specular grazing incidence scattering takes place. This review d
iscusses this new frontier of reflectometry, describing the advances that a
re taking place in linking the observations of the scattering at grazing in
cidence with the size, the statistics, and the magnetic orientation of the
domains. The article discusses also the progress made in linking the domain
distribution thus found with the transport properties of these nanomagneti
c systems. (C) 2001 Published by Elsevier Science B.V.