Structure and fluctuations of liquid surfaces and interfaces

Authors
Daillant, J Mora, S Fradin, C Alba, M Braslau, A Luzet, D
Citation
J. Daillant et al., Structure and fluctuations of liquid surfaces and interfaces, APPL SURF S, 182(3-4), 2001, pp. 223-230
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
182
Issue
3-4
Year of publication
2001
Pages
223 - 230
Database
ISI
SICI code
0169-4332(20011022)182:3-4<223:SAFOLS>2.0.ZU;2-3
Abstract
X-ray scattering techniques are increasingly used for the study of liquid s urfaces and interfaces. We give here scattering cross-sections for diffract ion or diffuse scattering from liquid interfaces and we discuss the example s of the liquid-vapour interface and of films at a liquid-liquid interface. We show that the interfacial structure can be understood as resulting of t he interplay between thermal fluctuations, van der Waals forces, and elasti c properties. (C) 2001 Elsevier Science B.V. All rights reserved.