X-ray photo-emission spectroscopic study on Sm0.85Nd0.15Se

Authors
Ariponnammal, S Jayavel, R Natarajan, S
Citation
S. Ariponnammal et al., X-ray photo-emission spectroscopic study on Sm0.85Nd0.15Se, INT J MOD B, 15(26), 2001, pp. 3465-3470
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
ISSN journal
02179792 → ACNP
Volume
15
Issue
26
Year of publication
2001
Pages
3465 - 3470
Database
ISI
SICI code
0217-9792(20011020)15:26<3465:XPSSOS>2.0.ZU;2-G
Abstract
The X-ray photo-emission spectroscopy (XPS) measurements have been performe d on Sm0.85Nd0.15Se. The results have shown that the Sm ion in the compound is existing in divalent state and there is no inter configuration mixing ( ICF). Theoretically calculated valence also supports the conclusion drawn f rom XPS studies.