Dc-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure

Citation
H. Chazono et H. Kishi, Dc-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure, JPN J A P 1, 40(9B), 2001, pp. 5624-5629
Citations number
31
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
9B
Year of publication
2001
Pages
5624 - 5629
Database
ISI
SICI code
Abstract
The impedance of a BaTiO3 (BT)-based multilayer ceramic capacitor with a ni ckel internal electrode (Ni-MLCC) was investigated by measuring the frequen cy domain at various temperatures. All the obtained impedance data could be successfully fitted to a 4-RC section electrical equivalent network. The 4 -RC section electrical equivalent network was successfully correlated to th e microstructure: the core, the shell, the grain boundary, and the ceramic/ internal electrode interface regions. Based on this electrical equivalent n etwork, the electrical properties including the Curie-Weiss law, the curren t-voltage characteristics, and dc electrical degradation, were well explain ed. A model for the degradation behavior for BT-based Ni-MLCC with thin act ive layer thickness was proposed.