H. Chazono et H. Kishi, Dc-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure, JPN J A P 1, 40(9B), 2001, pp. 5624-5629
The impedance of a BaTiO3 (BT)-based multilayer ceramic capacitor with a ni
ckel internal electrode (Ni-MLCC) was investigated by measuring the frequen
cy domain at various temperatures. All the obtained impedance data could be
successfully fitted to a 4-RC section electrical equivalent network. The 4
-RC section electrical equivalent network was successfully correlated to th
e microstructure: the core, the shell, the grain boundary, and the ceramic/
internal electrode interface regions. Based on this electrical equivalent n
etwork, the electrical properties including the Curie-Weiss law, the curren
t-voltage characteristics, and dc electrical degradation, were well explain
ed. A model for the degradation behavior for BT-based Ni-MLCC with thin act
ive layer thickness was proposed.