Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry

Citation
Mp. Mateo et al., Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry, J ANAL ATOM, 16(11), 2001, pp. 1317-1321
Citations number
20
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN journal
02679477 → ACNP
Volume
16
Issue
11
Year of publication
2001
Pages
1317 - 1321
Database
ISI
SICI code
0267-9477(2001)16:11<1317:IDPOLM>2.0.ZU;2-T
Abstract
Laser-induced plasma spectrometry (LIPS) is an appealing technique for dept h profiling purposes due to its capabilities for performing fast analysis i n air at atmospheric pressure without limitations of sample size or nature. At a fixed laser wavelength, pulse width, experiment geometry and sample t ype, the irradiance is the factor that will affect both the averaged ablati on rate and depth resolution. In the present work, a detailed description o f the effect of laser irradiance on averaged ablation rate and depth resolu tion of Ni-Cu-coated brass samples is presented. The results demonstrate th at the best depth resolution does not correspond with the minimum ablation rate. Several facts concerning the redeposition of material around the rim of the craters and energy gradients in the laser beam are proposed to expla in the experimental results.