Robust Rietveld refinement in the presence of impurity phases

Authors
Citation
Wif. David, Robust Rietveld refinement in the presence of impurity phases, J APPL CRYS, 34, 2001, pp. 691-698
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
34
Year of publication
2001
Part
6
Pages
691 - 698
Database
ISI
SICI code
0021-8898(200112)34:<691:RRRITP>2.0.ZU;2-9
Abstract
A modified least-squares analysis is presented that allows reliable structu ral parameters to be extracted from a powder diffraction pattern even in th e presence of a substantial unmodelled impurity contribution. The algorithm is developed within the context of Bayesian probability theory. Experiment al points that fall above those calculated, and are thus more probably from impurity peaks, are systematically down-weighted. This approach is illustr ated with a two-phase example.