Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

Rietveld refinements of corundum, a rutile and anatase nanocrystalline synt hetic mixture, and gypsum, on laboratory energy dispersive X-ray diffractio n (EDXD) data are reported. Cell parameters, positional and displacement pa rameters are in reasonable agreement with single-crystal reference data, de spite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained refinement) with counting times as s hort as 1000 s.