Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method

Citation
Dx. Zhao et al., Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method, J APPL PHYS, 90(11), 2001, pp. 5561-5563
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
90
Issue
11
Year of publication
2001
Pages
5561 - 5563
Database
ISI
SICI code
0021-8979(200112)90:11<5561:PPOMAT>2.0.ZU;2-X
Abstract
The photoluminescence properties of MgxZn1-xO alloy thin films fabricated b y the sol-gel deposition method were studied. The Mg2+ content in the films was up to 0.36 and they had the ZnO wurtzite structure. The band gap of th e films can be controlled between 3.40 and 3.93 eV by adjusting the Mg2+ pr oportions. Transmittance spectroscopy was used to characterize the excitoni c structure of the alloys, which the excitonic character is clearly visible at room temperature. The intense ultraviolet photoluminescence was observe d at room temperature. This emission is indicative of the excitonic nature of the material. (C) 2001 American Institute of Physics.