Sd. Lin et Cp. Lee, Hole Schottky barrier height enhancement and its application to metal-semiconductor-metal photodetectors, J APPL PHYS, 90(11), 2001, pp. 5666-5669
Hole Schottky barrier heights on GaAs have been studied experimentally by u
sing a conventional metal-semiconductor-metal photodetector (MSMPD) structu
re. The Schottky barrier height for holes was obtained directly by the hole
-current dominated dark current measurement of the MSMPD. With a thin, high
ly doped surface layer, control of the Schottky barrier heights for holes f
rom 0.48 to 0.79 eV was obtained. By using these engineered Schottky contac
ts in the MSMPDs, over three orders of magnitude reduction in the dark curr
ents of the MSMPDs was achieved. (C) 2001 American Institute of Physics.