Frequency response verification of analog circuits using global optimization techniques

Citation
S. Seshadri et Ja. Abraham, Frequency response verification of analog circuits using global optimization techniques, J ELEC TEST, 17(5), 2001, pp. 395-408
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
17
Issue
5
Year of publication
2001
Pages
395 - 408
Database
ISI
SICI code
0923-8174(200110)17:5<395:FRVOAC>2.0.ZU;2-9
Abstract
This paper develops a new formal technique to verify the frequency response of analog circuits using global optimization techniques. Since simulation- based approaches are unable to cover the design space, there is a need for formal approaches to verify large circuits. Drawing parallels from the digi tal domain, the verification problem in the analog domain is modeled as a n on-linear optimization problem and solved using global optimization techniq ues by ensuring that the implementation response is bounded within an envel ope around the specification. We also address the problem of verifying freq uency response under the influence of parameter variations. Direct as well as indirect techniques are illustrated using accurate frequency response mo dels. Experimental results are presented to show the effectiveness of the p roposed methodology.