Effect of cycling on debris propensity in a linear tape transport

Citation
B. Bhushan et Ps. Mokashi, Effect of cycling on debris propensity in a linear tape transport, J INF S P S, 3(3-4), 2001, pp. 267-275
Citations number
13
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
JOURNAL OF INFORMATION STORAGE AND PROCESSING SYSTEMS
ISSN journal
10998047 → ACNP
Volume
3
Issue
3-4
Year of publication
2001
Pages
267 - 275
Database
ISI
SICI code
1099-8047(200107/10)3:3-4<267:EOCODP>2.0.ZU;2-0
Abstract
Debris generation at the head-tape interface causes additional physical sep aration between the head and the tape. In addition, tape edge quality can p roduce loose debris from cracked, torn, or otherwise damaged edges progress ively with cycling. The changes in topography of the tape surface occurring as a result of the sliding of the tape on the head can also govern debris generation at the head-tape interface. The objective of this research is to study the effect of tape cycling on these parameters of the head-tape inte rface using various measurement techniques. Loose debris generation is stud ied qualitatively and quantitatively on commercial read/write head samples and commercial metal particle tape. It is found that loose debris increases almost linearly with the number of cycles. The progressive degradation of tape edges with the increasing number of cycles is a primary contributor to continuous generation. Burnishing of the tape surface due to cycling, whic h affects debris generation, is another contributor.