Microhardness indentation size effect in flux-grown crystals of rare earthaluminates

Authors
Gong, JG Guan, ZD
Citation
Jg. Gong et Zd. Guan, Microhardness indentation size effect in flux-grown crystals of rare earthaluminates, J MAT SCI T, 17, 2001, pp. S85-S88
Citations number
11
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
ISSN journal
10050302 → ACNP
Volume
17
Year of publication
2001
Supplement
1
Pages
S85 - S88
Database
ISI
SICI code
1005-0302(2001)17:<S85:MISEIF>2.0.ZU;2-6
Abstract
The previously reported results of microhardness measurements on flux-grown crystals of rare earth aluminates were re-examined in this paper to explor e the applicability of the proportional specimen resistance (PSR) model to describe the indentation size effect. It was found that the PSR model is in sufficient for describing the experimental data and a modified form of this model! was proposed based on the consideration of the effect of surface st ress state on hardness testing.