We report on the formation of a new material, C40 TiSi2, using pulsed laser
annealing. On the basis of this laser-induced C40 TiSi2, the growth of the
technologically important C54 phase is significantly promoted and can be a
ccomplished with a subsequent rapid thermal anneal or furnace annealing at
temperatures far below that for the normal C54 formation. The undesirable C
49 TiSi2 is completely bypassed. C40 TiSi2 can also be easily transformed t
o the C54 phase with thermal treatments and result in the formation of a pu
re C54 TiSi2 layer. The synthesis of C40 phase without the additional refra
ctory metals and its promotion effect on the C54 phase formation have great
potential for applications in the integrated circuit industry for 0.10 mum
technology node and beyond. (C) 2001 The Electrochemical Society.