Low microdivergence medium-mass ion beam produced from a N2O cryogenic diode

Citation
K. Kasuya et al., Low microdivergence medium-mass ion beam produced from a N2O cryogenic diode, LASER PART, 19(2), 2001, pp. 309-316
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
LASER AND PARTICLE BEAMS
ISSN journal
02630346 → ACNP
Volume
19
Issue
2
Year of publication
2001
Pages
309 - 316
Database
ISI
SICI code
0263-0346(200106)19:2<309:LMMIBP>2.0.ZU;2-L
Abstract
Medium-mass ion beams including nitrogen and oxygen were produced from a cr yogenic diode with N2O ice as the ion source. The nominal diode voltage was 300-400 kV, and the peak ion current was 240 A. The beam divergence angle was measured with a five-aperture time-integrated pinhole camera. The five camera images were analyzed to estimate the spatial distribution of the bea m source divergence angle along the anode radius, yielding a value of 5-6 m rad for the average microdivergence. This is low enough for this ion source to be studied further in the near future. If possible, we want to consider this as one of the probable candidate ion sources for ion beam drivers for future inertial confinement fusion (ICF) and inertial fusion energy (IFE) applications.