Xenon excimer compounds with oxygen in inert-gas crystal matrices

Xenon excimer compounds with oxygen in low-temperature inert-gas (R) crysta l matrices are investigated. The transformation of the excimer emission spe ctrum as a reslt of a change in the Xe concentration is analyzed. It is sho wn that the luminescence band with a peak near 1.7 eV could be due to the s uperposition of two bands with E-max=1.8 and 1.72 eV. The higher-energy ban d with E-max=1.8 eV is observed at low xenon concentration, and it can be i nterpreted as a transition from the 1(1)Pi state of the complex XeO* to the lowest state XeO X(3)Pi. The band with E-max=1.72 eV, which predominates i n the intrinsic Xe matrix with oxygen impurity and high-concentrated soluti ons R+Xe+O-2 is attributed to emission of the triatomic excimer Xe2O*. A co mparative analysis of the experimental data and theoretical calculations, o btained for analogous compounds of xenon halides and hydrides as well as th e xenon compound with the isoelectronic S atom, is performed. The results s uggest that the 3.33 and 3.58 eV bands observed in the xenon matrix belong to emission of charge-transfer complexes Xe2+O- and Xe2+S-. (C) 2001 Americ an Institute of Physics.