SrBi2Ta2O9 (SBT) thin films on quartz substrates were prepared by use of th
e pulsed-laser deposition technique. The nonlinear refractive indices, n(2)
, Of the SBT films were measured by use of z-scan techniques with picosecon
d pulses. Large negative nonlinear refractive indices of 3.84 and 3.58 cm(2
)/GW were obtained for the wavelengths 532 nm and 1.064 mum, respectively.
The two-photon absorption coefficient was determined to be 7.3 cm/GW for 53
2 nm. The limiting behavior of SBT thin film on a quartz substrate was inve
stigated in an f/5 defocusing geometry by use of 38-ps-duration, 532-nm, 1.
064-mum. laser excitation. (C) 2001 Optical Society of America.