Study of V-I curve of Tl-2212 film

The V-I characteristic curves of T1-2212 thin film at different applied mag netic fields and temperatures were measured by an electric transport method . To understand the experimental data, a model, which contains two paramete rs (n and j(c0)), to describe the local E-j relation was proposed. To verif y the model. we calculated V-I curves of a thin film with a rectangular cro ss-section by solved electric-dynamical equation plus the model as a materi al equation. Comparison between the measured and calculated V-1 curves show s a satisfactory agreement, demonstrating that the model can well describe the local field-current relation. In addition. the situation for a sample w ith a rectangular cross-section was discussed. (C) 2001 Elsevier Science B. V. All rights reserved.