Characterization of nano-dimensional thin-film elastic moduli using magnetoelastic sensors

Citation
S. Schmidt et Ca. Grimes, Characterization of nano-dimensional thin-film elastic moduli using magnetoelastic sensors, SENS ACTU-A, 94(3), 2001, pp. 189-196
Citations number
28
Categorie Soggetti
Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS A-PHYSICAL
ISSN journal
09244247 → ACNP
Volume
94
Issue
3
Year of publication
2001
Pages
189 - 196
Database
ISI
SICI code
0924-4247(20011120)94:3<189:CONTEM>2.0.ZU;2-8
Abstract
Application of magnetoelastic thick-film sensors to the measurement of thin -film elastic moduli is described in this study. An analytical model is der ived, that relates the resonant frequency of a magnetoelastic sensor to the elasticity and density of an applied thin-film. Limits of the model are an alyzed, and related to experimental measurements using thin-films of silver and aluminum. For 500 nm thick-films, the measured Young's modulus of elas ticity for Al and Ag is found to be within 1.6% of standard data. Using com mercially available magnetoelastic sensors, the elasticity of coatings, app roximately 30 nm thick, can readily be measured. (C) 2001 Elsevier Science B.V. All rights reserved.