Determination of the morphology factor of oxide layers

Citation
Lm. Da Silva et al., Determination of the morphology factor of oxide layers, ELECTR ACT, 47(3), 2001, pp. 395-403
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHIMICA ACTA
ISSN journal
00134686 → ACNP
Volume
47
Issue
3
Year of publication
2001
Pages
395 - 403
Database
ISI
SICI code
0013-4686(20011031)47:3<395:DOTMFO>2.0.ZU;2-4
Abstract
From the linear dependencies of the voltammetric capacitive current, i(c), with the potential sweep rates, nu, observed in the low and high domains, i t is possible to determine the inner and outer differential capacities of o xide coatings. The morphological factor,phi, defined as the ratio of the in ner and total differential capacities (C-d,C-i/Cd) shows a linear relations hip with the radius/ionic charge ratio of the anion of the supporting elect rolyte. The dependence of the capacitive voltammetric charge, q(c), on nu w as interpreted on the basis of a purely capacitive model for the oxide/solu tion interface. (C) 2001 Elsevier Science Ltd. All rights reserved.