DC scanning thermal microscopy: Characterisation and interpretation of themeasurement

Citation
S. Gomes et al., DC scanning thermal microscopy: Characterisation and interpretation of themeasurement, INT J TH SC, 40(11), 2001, pp. 949-958
Citations number
23
Categorie Soggetti
Mechanical Engineering
Journal title
INTERNATIONAL JOURNAL OF THERMAL SCIENCES
ISSN journal
12900729 → ACNP
Volume
40
Issue
11
Year of publication
2001
Pages
949 - 958
Database
ISI
SICI code
1290-0729(200111/12)40:11<949:DSTMCA>2.0.ZU;2-1
Abstract
The used Scanning Thermal Microscopy (SThM) probe is a thin Pt resistance w ire acting as a heat source and as a detector simultaneously. Its energetic balance is investigated by the study of the temperature profile along the probe. A theoretical approach of the measurement, based on this investigati on, is then proposed. Simulations with this modelling are shown to predict how the heat, electrically produced in the probe, is dissipated in the prob e-sample system. In particular, it is shown that the steady-state of conduc tion losses to the thermal element support varies versus the thermal conduc tivity of the sample and can lead to bad interpretations of the measurement . (C) 2001 editions scientifiques et medicales Elsevier SAS.