Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex : C

Authors
Morita, K Itoh, KM Hoffmann, L Nielsen, BB Harima, H Mizoguchi, K
Citation
K. Morita et al., Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex : C, JPN J A P 1, 40(10), 2001, pp. 5905-5906
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
40
Issue
10
Year of publication
2001
Pages
5905 - 5906
Database
ISI
SICI code
Abstract
The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGe:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spe ctroscopy at room- and liquid-nitrogen-temperatures. The position of the Ra man peaks due to LVM of carbon shifts linearly to lower frequencies with in creasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman m easurement agree very well with those determined by Hoffmann et al. in infr ared (IR) absorption recently.