M. Innocenti et al., Electrochemical behavior of As on silver single crystals and experimental conditions for InAs growth by ECALE, J ELEC CHEM, 514(1-2), 2001, pp. 75-82
Different experimental conditions for InAs growth by ECALE were examined. I
n layers were constantly deposited at underpotential from acetic buffer sol
utions, whereas As layers were obtained by three different approaches. Firs
t, As-upd layers were obtained by reducing an excess of previously deposite
d As(0) to AsH3 from NaOH solutions obtaining no more than five layers of I
nAs. Secondly, As was deposited at underpotential from ammonia buffer solut
ions of pH 9.6; at this pH the upd of both In and As coincide. However, XPS
analysis on a sample revealed that only a low percentage, 25%, of As was i
n the reduced - III state, whereas most of it was in the oxidized + III sta
te. The incomplete charge transfer in AsO2- reduction excludes the possibil
ity of InAs formation. The effective way of depositing InAs on Ag(111) cons
ists in depositing bulk As(0), limiting the extent of deposition through th
e control of the time as well as the potential of deposition. Thus. As laye
rs were obtained from acetic buffer solutions at -0.7 V. The composition of
samples prepared by this procedure was determined by XPS and by the classi
cal methods of analysis. Both methods gave the 1:1 stoichiometric ratio, ty
pical of a compound, though the extent of deposition seems to be low. Howev
er, the AFM morphological investigation of samples obtained with 50, 75 and
100 deposition cycles point to a high quality compound. (C) 2001 Elsevier
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