F. Aminian et M. Aminian, Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and Fourier transforms as preprocessors, J ELEC TEST, 17(6), 2001, pp. 471-481
Citations number
18
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
A neural-network based analog fault diagnostic system is developed for nonl
inear circuits. This system uses wavelet and Fourier transforms, normalizat
ion and principal component analysis as preprocessors to extract an optimal
number of features from the circuit node voltages. These features are then
used to train a neural network to diagnose soft and hard faulty components
in nonlinear circuits. Our neural network architecture has as many outputs
as there are fault classes where these outputs estimate the probabilities
that input features belong to different fault classes. Application of this
system to two sample circuits using SPICE simulations shows its capability
to correctly classify soft and hard faulty components in 95% of the test da
ta. The accuracy of our proposed system on test data to diagnose a circuit
as faulty or fault-free, without identifying the fault classes, is 99%. Bec
ause of poor diagnostic accuracy of backpropagation neural networks reporte
d in the literature (Yu et al., Electron. Lett., Vol. 30, 1994), it has bee
n suggested that such an architecture is not suitable for analog fault diag
nosis (Yang et al., IEEE Trans. on CAD, Vol. 19, 2000). The results of the
work presented here clearly do not support this claim and indicate this arc
hitecture can provide a robust fault diagnostic system.