Fault diagnosis for linear analog circuits

Citation
Jw. Lin et al., Fault diagnosis for linear analog circuits, J ELEC TEST, 17(6), 2001, pp. 483-494
Citations number
19
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
17
Issue
6
Year of publication
2001
Pages
483 - 494
Database
ISI
SICI code
0923-8174(2001)17:6<483:FDFLAC>2.0.ZU;2-6
Abstract
This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete sig nal flow graph, then constructs "diagnosing evaluators," which model the fa ulty components, to form a diagnosis configuration to diagnose the faults t hrough digital simulation. This saves much computation time. Furthermore, a simple method to un-power OP's is also proposed to differentiate equivalen t faults. The scheme can diagnose faults in passive components as well as a ctive faults in OP's.