This paper presents a novel scheme to diagnose single and double faults for
linear analog circuits. The scheme first proposes a simple transformation
procedure to transform the tested linear analog circuit into a discrete sig
nal flow graph, then constructs "diagnosing evaluators," which model the fa
ulty components, to form a diagnosis configuration to diagnose the faults t
hrough digital simulation. This saves much computation time. Furthermore, a
simple method to un-power OP's is also proposed to differentiate equivalen
t faults. The scheme can diagnose faults in passive components as well as a
ctive faults in OP's.