Sk. Hoffmann et al., Electron spin relaxation in pseudo-Jahn-Teller low-symmetry Cu(II) complexes in diaqua(L-aspartate)Zn(II) center dot H2O crystals, J MAGN RES, 153(1), 2001, pp. 92-102
Low-temperature (4-55 K) pulsed EPR measurements were performed with the ma
gnetic field directed along the z-axis of the g-factor of the low-symmetry
octahedral complex [Cu-63(L-aspartate)(2)(H2O)(2)] undergoing dynamic Jahn-
Teller effect in diaqua(L-aspartate)Zn(II) hydrate single crystals. Spin-la
ttice relaxation time T-1 and phase memory time Tm were determined by the e
lectron spin echo (ESE) method. The relaxation rate 1/T-1 increases strongl
y over 5 decades in the temperature range 4-55 K. Various processes and mec
hanisms of T-1-relaxation are discussed, and it is shown that the relaxatio
n is governed mainly by Raman relaxation processes with the Debye temperatu
re Theta (D) = 204 K, with a detectable contribution from disorder in the d
oped Cu2+ ions system below 12 K. An analytical approximation of the transp
ort integral I-8 is given in temperature range T = 0.025-10 Theta (D) and a
pplied for computer fitting procedures. Since the Jahn-Teller distorted con
figurations differ strongly in energy (delta (12) = 240 cm(-1)), there is n
o influence of the classical vibronic dynamics mechanism on T-1. Dephasing
of the ESE (phase relaxation) is governed by instantaneous diffusion and sp
ectral diffusion below 20 K with resulting rigid lattice value 1/T-M(0) = 1
.88 MHz. Above this temperature the relaxation rate 1/T-M increases upon he
ating due to two mechanisms. The first is the phonon-controlled excitation
to the first excited vibronic level of energy Delta = 243 cm(-1), with subs
equent tunneling to the neighbor potential well. This vibronic-type dynamic
s also produces a temperature-dependent broadening of lines in the ESEEM sp
ectra. The second mechanism is produced by the spin-lattice relaxation. The
increase in T-M is described in terms of the spin packets forming inhomoge
neously broadened EPR lines. (C) 2001 Academic Press.