Uncertainty of complex permittivity measurements by split-post dielectric resonator technique

Split-post dielectric resonators operating at frequencies 1.4-5.5 GHz were used to measure complex permittivity of single crystal standard reference d ielectric materials with well known dielectric properties previously measur ed by other techniques. Detailed error analysis of permittivity and dielect ric loss tangent measurements has been performed. It was proved both theore tically and experimentally that using split post resonators it is possible to measure permittivity with uncertainty about 0.3% and dielectric loss tan gent with resolution 2 x 10(-5) for well-machined laminar specimens. (C), 2 001 Elsevier Science Ltd. All rights reserved.