K. Nakahara et al., 1.3-MU-M INGAASP-INP N-TYPE MODULATION-DOPED STRAINED MULTI-QUANTUM-WELL LASERS, IEEE journal of selected topics in quantum electronics, 3(2), 1997, pp. 166-172
The use of n-type modulation doping to reduce the threshold current, t
he carrier lifetime, and the infernal loss in 1.3-mu m InGaAsP-InP str
ained multiquantum-well (MQW) lasers is experimentally demonstrated. T
he threshold current density, the carrier lifetime, and the internal l
oss were reduced by about 33% 36%, and 28%, respectively, as compared
with an undoped MQW laser, Moreover, the turn-on delay time in the n-t
ype modulation-doped MQW lasers with a low-leakage buried heterostruct
ure was reduced by about 35%, These results confirm the suitability of
this type of laser for use in the basic structure of a monolithic las
er array used as a light source for high-density parallel optical inte
rconnection.