CURRENT SELF-DISTRIBUTION EFFECT IN DIODE-LASERS - ANALYTIC CRITERIONAND NUMERICAL STUDY

Citation
Pg. Eliseev et al., CURRENT SELF-DISTRIBUTION EFFECT IN DIODE-LASERS - ANALYTIC CRITERIONAND NUMERICAL STUDY, IEEE journal of selected topics in quantum electronics, 3(2), 1997, pp. 499-506
Citations number
15
Categorie Soggetti
Engineering, Eletrical & Electronic",Optics
ISSN journal
1077260X
Volume
3
Issue
2
Year of publication
1997
Pages
499 - 506
Database
ISI
SICI code
1077-260X(1997)3:2<499:CSEID->2.0.ZU;2-M
Abstract
We consider a current self-distribution (current crowding) effect that can be induced by stimulated recombination in diode lasers. In partic ular, we identify conditions when the injection current density can be sensitive to inhomogeneities of carrier recombination rate. In respon se to a locally enhanced carrier consumption, the current injection be comes itself inhomogeneous. An analytic criterion is proposed to predi ct when this effect can lead to suppression of spatial hole-burning, p roviding improved laser mode stability and spatial stability of the la ser beam. Adequacy of the proposed analytic approach is verified by nu merical modeling.