Dynamics of surface crystallization and melting in polyethylene and poly(ethylene oxide) studied by temperature-modulated DSC and heat wave spectroscopy

Polymers with a high longitudinal diffuse mobility within the crystallites are known to show a continuous, reversible surface melting and crystallizat ion; temperature changes are accompanied by shifts of the crystalline-amorp hous interface, resulting in a crystal thickening on cooling and a thickeni ng of the amorphous layers on heating. In measurements of the dynamic heat capacity c*(omega), the process shows up as a strong excess contribution wh ich increases up to the temperature of the final irreversible crystal melti ng. Experiments were carried out for linear polyethylene (LPE) and poly(eth ylene oxide) (PEO). Employing both a temperature-modulated differential sca nning calorimeter (TMDSC) and a heat wave spectrometer (HWS), thereby cover ing the frequency range from 10(-3) to 10(2) Hz, we could analyze the proce ss dynamics. The times required for the surface melting or crystallization were deduced from the change at the signal amplitude with frequency. They a re remarkably long. For temperatures near to the respective final melting p oints we found about 12 s for the LPE sample and 120 s for PEO. The dynamic heat capacity of PE measured by TMDSC at low frequencies corresponds to th e temperature dependence of the crystallinity. A comparison with the result s of a SAXS structure analysis showed perfect agreement. For PEO the quasi- stationary conditions were not reached. Even at the lowest frequencies prob ed by TMDSC, the dynamic heat capacity was still below the value expected o n a basis of the temperature dependence of the crystallinity determined by SAYS. In determinations of the dynamic heat capacity by TMDSC and HWS, it i s in general necessary to correct the raw data to account for the inner hea t flow resistance, additional heat capacities, and delay times introduced b y the electronics. The corrections can be accomplished by an appropriate mo deling of the measuring devices.