The role of the transition function in a continuum model for kinetic roughening and coarsening in thin films

Authors
Citation
O. Stein, The role of the transition function in a continuum model for kinetic roughening and coarsening in thin films, MAT SC S PR, 4(5), 2001, pp. 405-416
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
ISSN journal
13698001 → ACNP
Volume
4
Issue
5
Year of publication
2001
Pages
405 - 416
Database
ISI
SICI code
1369-8001(200110)4:5<405:TROTTF>2.0.ZU;2-X
Abstract
In the model for kinetic roughening and coarsening in high-temperature supe r-conducting thin films that Ortiz et al. suggest in (J. Mech. Phys. Solids 47(1999) 697.) a transition function is used which takes the energetics of the boundary layer at the film/substrate interface into account. Apart fro m having some basic properties, this function can be chosen quite arbitrari ly. We show that certain decay and concavity properties of this function have a major impact on the film growth. In particular, a modified decay can circu mvent the occurrence of negative film heights which is predicted in the ori ginal model, and a change in curvature alters stability properties of the f ilm. These observations not only underscore the importance of the transitio n function in the model, but they also suggest to estimate the actual trans ition function from experimental data or from atomistic simulation. (C) 200 1 Elsevier Science Ltd. All rights reserved.