Fa. Stam et E. Davitt, Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints, MICROEL REL, 41(11), 2001, pp. 1815-1822
Accelerated reliability tests have been performed on leadless and leaded le
ad-free and lead containing SMT component assemblies. Results so far have s
hown that lead-free reflow soldering is a viable alternative for convention
al lead based reflow soldering. The selected ternary eutectic solder alloy
SnAg3.8Cu0.7 requires higher processing temperatures which could restrict t
he use of certain board and component types, but other than that no major m
odifications seem necessary. Although better SnAg3.8Cu0.7 bulk mechanical p
roperties were obtained compared to the near eutectic lead bearing bulk sol
der properties, reflowed solder joints did not reflect this difference. In
general, quite similar reliability results were obtained as found for the l
ead based solders. Dependent on board and component metallisations and use
environment, the reliability of the lead-free solders could perform better
or worse than the lead based solders. Temperature dependent aspects such as
solderability and mechanical behaviour of the lead-free assemblies could p
lay a role in this. Although microstructural differences can be seen betwee
n the lead-free and lead bearing solder joints, similar joint failure mecha
nisms occur, Resistor solder joint cracks propagate from underneath the com
ponent through either transgranular (lead-free) grains or along inter.-ranu
lar (lead) grain boundaries between lead-rich and tin-rich areas and into c
oarsened regions near the component terminations. Gullwing lead cracks were
seen propagating from the heel fillet along the lead/solder interfacial in
termetallic mostly (some cracks started in the heel fillet and propagated t
hrough the solder body dispersed with coarsened spherical Ag3Sn intermetall
ic particles). Package design and leadframe material seem to play a more im
portant role in the fatigue mechanism than the change in microstructure of
the solder joint. (C) 2001 Elsevier Science Ltd. All rights reserved.