Citation
P. Bratek et A. Kos, A method of thermal testing of microsystems, MICROEL REL, 41(11), 2001, pp. 1877-1887
Citations number
27
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714
→ ACNP
Volume
41
Issue
11
Year of publication
2001
Pages
1877 - 1887
Database
ISI
SICI code
0026-2714(200111)41:11<1877:AMOTTO>2.0.ZU;2-3
Abstract
The paper presents a method of VLSI circuits testing using thermal phenomen
on. The method is based on an original algorithm of placing temperature sen
sors on the chip surface and analysing temperature measurement results. The
method enables both failure detection and location. Examples and results o
f analyses are presented. (C) 2001 Elsevier Science Ltd. All rights reserve
d.