Electron-hole separation studies near the nu=1 quantum Hall state in modulation-doped GaAs/(Al,Ga)As single heterojunctions in high magnetic fields -art. no. 195302

Citation
Ym. Kim et al., Electron-hole separation studies near the nu=1 quantum Hall state in modulation-doped GaAs/(Al,Ga)As single heterojunctions in high magnetic fields -art. no. 195302, PHYS REV B, 6419(19), 2001, pp. 5302
Citations number
31
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6419
Issue
19
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011115)6419:19<5302:ESSNTN>2.0.ZU;2-Q
Abstract
Magnetophotoluminescence (MPL) studies as a function of carrier concentrati on are reported for a series of very high mobility n-type modulation-doped GaAs/(Al,Ga)As single heterojunctions. The measurements were made in high m agnetic fields to similar to 60 T and at temperatures in the 0.4-2.1 K rang e. At low fields (nu >2), the MPL recombination is dominated a free carrier like excitonic transition as an energy close to the free exciton in bulk Ga As. The energy and intensity of this excitation undergoes Shubnikov-de Haas -type oscillations at even integer filling factors (nu> 2) with increasing field. At nu= 2(-), an second strong exciton transition appears at a lower energy primarily in sigma (-) polarization due to a spin up arrow electron recombining with a valence-band hole. It rapidly gains intensity between 2> nu> 1, but disappears at nu= 1(+). At nu= 1(-) another redshifted transiti on emerges that has been described as a recombination of an electron in an initial "free hole state." Its intensity in sigma (-) polarization increase s and reaches a maximum between 1> nu >1/3. Such behavior becomes more pron ounced as the carrier density increases. The redshift at nu= 1 has been cor related with recent theoretical models describing the theory of photolumine scence of two-dimensional electron systems. It has been used to determine t he electron-hole separation as a function of carrier concentration.