Analysis of disordered stripe magnetic domains in strained epitaxial Ni(001) films - art. no. 184406

Citation
S. Hameed et al., Analysis of disordered stripe magnetic domains in strained epitaxial Ni(001) films - art. no. 184406, PHYS REV B, 6418(18), 2001, pp. 4406
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6418
Issue
18
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011101)6418:18<4406:AODSMD>2.0.ZU;2-K
Abstract
The disordered stripe domain structures in strained epitaxial Ni(001) films with film thickness ranging from 10 to 220 nm have been studied by magneti c force microscopy. A theoretical model of periodic stripe domain structure s with tilted partial flux closure domains has been successfully applied to describe the features of these domain structures. The model predicts that the thinnest films (t < 25 nm) show no flux closure domains whereas thicker films have a significant volume fraction (<similar to>40%) of flux closure domains with the tilt angle varying continuously from being normal to the film's surface to parallel to the surface with increasing film thickness. T he tilt of the moments in the flux closure domains correspondingly gives ri se to an in-plane magnetization. in accordance to the experimental observat ion in these Ni films.