Finite-element modeling of extraordinary magnetoresistance in thin film semiconductors with metallic inclusions - art. no. 184410

Citation
J. Moussa et al., Finite-element modeling of extraordinary magnetoresistance in thin film semiconductors with metallic inclusions - art. no. 184410, PHYS REV B, 6418(18), 2001, pp. 4410
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6418
Issue
18
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011101)6418:18<4410:FMOEMI>2.0.ZU;2-3
Abstract
Using finite element analysis, the room temperature extraordinary magnetore sistance recently reported for a modified van der Pauw disk of InSb with a concentric embedded Au inhomogeneity has been calculated, using no adjustab le parameters, as a function of the applied magnetic field and the size/geo metry of the inhomogeneity. The finite element results are nearly identical to exact analytic results and are in excellent agreement with the correspo nding experimental measurements. Moreover, several important properties of the composite InSb/Au system such as the field dependence of the current fl ow and of the potential on the disk periphery have been deduced, It is foun d that both the EMR and output voltage depend sensitively on the placement and size of the current and voltage ports.