Gallium contacts on p-type silicon substrates

Citation
Mf. Stuckings et al., Gallium contacts on p-type silicon substrates, PROG PHOTOV, 9(6), 2001, pp. 409-416
Citations number
21
Categorie Soggetti
Environmental Engineering & Energy
Journal title
PROGRESS IN PHOTOVOLTAICS
ISSN journal
10627995 → ACNP
Volume
9
Issue
6
Year of publication
2001
Pages
409 - 416
Database
ISI
SICI code
1062-7995(200111/12)9:6<409:GCOPSS>2.0.ZU;2-L
Abstract
A significant reduction in contact resistance of palladium/silicon contacts was realised by the use of a thin intermediate gallium layer. The contact resistance of the palladium/gallium/silicon contact was found to be similar to aluminium/silicon contacts on 0.5 Omega cm silicon. Solar cells process ed on 1 Omega cm substrates with this structure demonstrated better contact properties than conventional aluminium/silicon contacts. The improved char acteristics are believed to be a result of gallium/silicon alloying at low temperature (400 degreesC). The palladium layer is critical as aluminium/ g allium/silicon layers show dramatically increased contact resistance. The p alladium silicide may interact with the aluminium layer to form a stable te rnary compound, preventing aluminium from penetrating deeper into the silic on. Copyright (C) 2001 John Wiley & Sons, Ltd.