Cm. Deegan et al., Novel technique for the extraction of ionization profiles from spatial density measurements, REV SCI INS, 72(12), 2001, pp. 4362-4365
A method has been devised to extract the two-dimensional ionization profile
s from spatially resolved ion density measurements made in a capacitively c
oupled argon rf plasma. This technique is valid if the production process i
s ionization and the loss process is ambipolar diffusion. As this procedure
calculates the total production (ionization) term, processes such as two-s
tep ionization and photoionization are included. The main benefit of this n
ew technique is that it extracts ionization rates that pertain to the total
ionization in the discharge. It follows that this technique could be used
to determine when other ionization processes (e.g., photo- and two-step ion
ization) are important. On testing with experimental data, the inversion pr
ocess was observed to reproduce the original source term, thereby verifying
that the iteration process converges to a real solution. The calculated io
nization rate using the integral method is in good agreement with the ioniz
ation profiles obtained from the density measurements. Hence, there is now
a method of determining the ionization rate that is independent of electron
energy probability function measurement and that includes all ionization p
rocesses, not just ground state ionization by electron-neutral collisions.
(C) 2001 American Institute of Physics.