Surface morphological characterization of yeast cells by scanning force microscopy

A scanning probe microscope was used to analyse surface morphological chara cteristics and adhesion forces of the yeast cell Candida parapsilosis 294 i ncubated at two temperatures (22 and 37 degreesC). The simultaneous use of contact atomic force microscopy and lateral force microscopy allows two reg ions to be distinguished on the surface of the microbial cell with differen t friction characteristics. In addition, measurements of force curves over each zone revealed very distinct values of the adhesion force. Both the adh esion force average on each zone and the one between them depend on incubat ion temperature. jointly, these results suggest some differences in the sur face composition of the cell wall between these regions. Copyright (C) 2001 John Wiley & Sons, Ltd.