Effects of temperature and Ar+ ion bombardment on the initial oxidation stages of polycrystalline aluminium with water vapour

Citation
T. Do et Ns. Mcintyre, Effects of temperature and Ar+ ion bombardment on the initial oxidation stages of polycrystalline aluminium with water vapour, SURF INT AN, 31(11), 2001, pp. 1068-1073
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
31
Issue
11
Year of publication
2001
Pages
1068 - 1073
Database
ISI
SICI code
0142-2421(200111)31:11<1068:EOTAAI>2.0.ZU;2-V
Abstract
The initial stages of oxide formation following the interaction of water va pour with polycrystalline aluminium surfaces have been studied using x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Att enuation of the electron signal from the metallic substrate has been used t o follow the oxidation kinetics of aluminium as a function of energy and do se of Ar+ ion bombardment and temperature. The effects of energy and doses of Arl ion bombardment on oxidation kinetics have been examined in the ener gy range 1-5 keV and ion dose ranging from 1.3 X 10(16) to 3.8 X 10(17) ion s cm(-2). Although the increase in energy of Ar+ ion bombardment slightly m odified the oxidation kinetics, the effects of ion dose on oxidation kineti cs are shown to be more complex. There is a threshold dose of Arl ions abov e which the surface activity becomes significantly reduced; this is ascribe d to cluster formation blocking the surface diffusion pathway in the near-s urface region. The oxidation kinetics of aluminium also have been studied i n a range of temperature from room temperature up to 573 K. As the temperat ure increases, the oxidation rate of aluminium decreases due to a decrease in the sticking probability of water molecules on the aluminium surfaces. T he observed temperature dependence of the oxidation kinetics is likely to b e due to a precursor mechanism of water desorption. Copyright (C) 2001 John Wiley & Sons, Ltd.