Direct imaging of plasma-polymerized chemical micropatterns

Both XPS and time-of-flight secondary ion mass spectrometry (ToF-SIMS) imag ing have been used to characterize chemically micropatterned surfaces forme d by plasma polymerization, using a copper transmission electron microscope grid as a mask. Micropatterns of spatially distinct regions of fluorine ca rboxylic acid and hydrocarbon functionalities have been imaged by ToF-SIMS, whereas imaging XPS has demonstrated the ability to produce patterns of ni trogen-containing functionalities. Features as small as 50 mum bars and 75 mum 'islands' have been imaged. The utility of these chemically defined pat terns has been demonstrated by the spatial binding of protein and by the at tachment of cerebellar granule neurons. Copyright (C) 2001 John Wiley & Son s, Ltd.