D. Wegrzynek et al., Evaluation of the energy-dispersive x-ray spectra of high-Z elements usingGaussian and Voigt peak shape profiles, X-RAY SPECT, 30(6), 2001, pp. 403-412
The AXIL computer program, aimed at x-ray spectral deconvolution, was exten
ded in order to take into account the broadening of peaks of K-series radia
tion of high-Z elements (Z > 50) due to the increasing contribution of the
natural linewidth to the peak width. This effect needs to be taken into acc
ount in energy-dispersive spectrometry of K-series radiation of heavy eleme
nts, such as W, Au, Pb and U. The so-called Voigt peak profile function was
implemented into the AXIL computer code. Based on the published literature
data, a library of natural atomic level widths was created, containing the
data for K, L-1, L-2, L-3 atomic level widths of elements up to Z = 94. Th
e database was necessary to calculate the Voigt peak profiles. The AXIL pro
gram user interface and the fitting procedures were adapted, allowing us to
perform spectral evaluation using either Gaussian or Voigt peak profiles.
The relevance of fitting the x-ray spectra of K-series radiation of high-Z
elements with the Voigt peak shape model versus Gaussian peak approximation
was thoroughly examined with the aid of simulated and measured spectra. Th
e experimental x-ray spectra were measured using a high-voltage x-ray tube
spectrometer utilizing a 130 kV/65 W tungsten anode x-ray tube and an ultra
-low energy germanium detector. The results obtained showed that when using
the Gaussian peak model the calculated peak areas and fitted peak widths a
re systematically biased. It was found that the value of the systematic err
or is a linear function of the ratio of the natural linewidth to the spectr
ometer energy resolution at the peak position. Copyright (C) 2001 John Wile
y & Sons, Ltd.