Evaluation of the energy-dispersive x-ray spectra of high-Z elements usingGaussian and Voigt peak shape profiles

Citation
D. Wegrzynek et al., Evaluation of the energy-dispersive x-ray spectra of high-Z elements usingGaussian and Voigt peak shape profiles, X-RAY SPECT, 30(6), 2001, pp. 403-412
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
30
Issue
6
Year of publication
2001
Pages
403 - 412
Database
ISI
SICI code
0049-8246(200111/12)30:6<403:EOTEXS>2.0.ZU;2-U
Abstract
The AXIL computer program, aimed at x-ray spectral deconvolution, was exten ded in order to take into account the broadening of peaks of K-series radia tion of high-Z elements (Z > 50) due to the increasing contribution of the natural linewidth to the peak width. This effect needs to be taken into acc ount in energy-dispersive spectrometry of K-series radiation of heavy eleme nts, such as W, Au, Pb and U. The so-called Voigt peak profile function was implemented into the AXIL computer code. Based on the published literature data, a library of natural atomic level widths was created, containing the data for K, L-1, L-2, L-3 atomic level widths of elements up to Z = 94. Th e database was necessary to calculate the Voigt peak profiles. The AXIL pro gram user interface and the fitting procedures were adapted, allowing us to perform spectral evaluation using either Gaussian or Voigt peak profiles. The relevance of fitting the x-ray spectra of K-series radiation of high-Z elements with the Voigt peak shape model versus Gaussian peak approximation was thoroughly examined with the aid of simulated and measured spectra. Th e experimental x-ray spectra were measured using a high-voltage x-ray tube spectrometer utilizing a 130 kV/65 W tungsten anode x-ray tube and an ultra -low energy germanium detector. The results obtained showed that when using the Gaussian peak model the calculated peak areas and fitted peak widths a re systematically biased. It was found that the value of the systematic err or is a linear function of the ratio of the natural linewidth to the spectr ometer energy resolution at the peak position. Copyright (C) 2001 John Wile y & Sons, Ltd.